Optics: measuring and testing – By polarized light examination – With birefringent element
Patent
1997-08-14
1999-10-19
Kim, Robert H.
Optics: measuring and testing
By polarized light examination
With birefringent element
356361, G01B 902
Patent
active
059698179
ABSTRACT:
Disclosed is an angle indexing precision measuring method and system capable of continuously measuring the precision in indexing the angle of a rotary table of a machine tool over 360.degree.. One of a laser interference unit and dual corner cube unit which constitute a laser interferometer is fixed to a table, and the other one thereof is attached to a rotating mechanism which is fixed to a portion other than the table and whose axis of rotation is aligned with the axis of rotation of the table. Within a range of angles within which the relative angle reaches one limit of a range of set angles equal to or smaller than a range of measurable angles, a step of rotating the table by a unit angle and a step of measuring the relative angle are repeated. After the relative angle reaches one limit of the range of set angles, a step of rotating the rotating mechanism is carried out until the relative angle between the two parts reaches the other limit of the range of set angles. These steps are carried out over a whole range of angles.
REFERENCES:
patent: 5237390 (1993-08-01), Chaney
Kim Robert H.
Tokyo Seimitsu Co. Ltd.
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