Method and apparatus for partial test-cause generation

Details Method and apparatus for partial test-cause generation Method and apparatus for partial test-cause generation

1987-08-13

1989-12-05

Gruber, Felix D.

Boots, shoes, and leggings

364550, 371 224, 371 251, G06F 1100, G06F 1122

Patent

active

048857122

ABSTRACT:
Disclosed is a test-cause generation method for implementing systematically the function test of logical devices. The method features the generation of partial test-causes for checking the functional relation at each state transition through the operations of entering a boolean function expressed in a decision table indicative of input-output correspondence, checking the constraint conditions for eliminating infeasible combinations between cause nodes, and expanding the decision table to produce all permissible partial test-causes.

REFERENCES:
patent: 4342093 (1982-07-01), Miyoshi
patent: 4467409 (1984-08-01), Potash et al.
patent: 4736338 (1988-04-01), Saxe et al.

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