Focal plane array test facility

Details Focal plane array test facility Focal plane array test facility

1993-05-28

1995-11-28

Hannaher, Constantine

Radiant energy

Calibration or standardization methods

G01D 1800

Patent

active

054710553

ABSTRACT:
A test system for completely characterizing all known types of infrared and ar-infrared detector arrays for FLIR imagers, which utilizes a number of different radiation sources, array supports, radiation filters, and radiation stops all remotely controlled and positioned by a computer which performs the test, sorts the data collected the results and presents it in a variety of formats. Also an automatic test method for characterizing infrared detectors using remote controlled radiation sources and dewar mounting devices under computer control.

REFERENCES:
patent: 4709141 (1987-11-01), Olsen
patent: 4712057 (1987-12-01), Pau
patent: 4885463 (1989-12-01), Wellman et al.
patent: 4975573 (1990-12-01), Girard
patent: 5175432 (1992-12-01), Reitman et al.

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