Method and apparatus for pattern recognition and detection

Details Method and apparatus for pattern recognition and detection Method and apparatus for pattern recognition and detection

1981-05-29

1983-11-08

Boudreau, Leo H.

Image analysis

Histogram processing

For setting a threshold

364725, 382 27, G06K 900

Patent

active

044146850

ABSTRACT:
Image analyzing apparatus and methods are disclosed for analyzing 3-dimensional as well as 2-dimensional images. The pixels of the 3-D images may be represented by multivalued digital data signals which are analyzed in one or more programmable neighborhood transformation stages. In the preferred embodiment, each stage is programmed with selected contribution values associated with each pixel in the neighborhood. The values of the data signals for each pixel are modified by these contribution values and the maximum value thereof is selected as the transformation output of the stage. A series of dilation/erosion transformations may be used to transform the original image matrix in such a manner so as to locate the position and/or identify the shape of particular objects contained in the original image.

REFERENCES:
patent: 3564498 (1971-02-01), Stern
patent: 3737855 (1973-06-01), Cutaia
patent: 3805035 (1974-04-01), Serra
patent: 3905045 (1975-09-01), Nickel
patent: 4293920 (1981-10-01), Merola
Bjorn Kruse, "A Parallel Picture Processing Machine", IEEE Transactions on Computers, vol. C-22, No. 12, Dec. 1973.
Yasuo Nakagawa and Azriel Rosenfeld, "A Note on the Use of Local min and max-Operations in Digital Picture Processing", IEEE Transactions on Systems, Man and Cybernetics, vol. SMC-8, No. 8, Aug. 1978.

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