Read voltage control device for semiconductor memory device

Details Read voltage control device for semiconductor memory device Read voltage control device for semiconductor memory device

1997-06-30

1999-02-09

Nelms, David

Static information storage and retrieval

Floating gate

Particular biasing

36518518, 365191, 365201, G11C 1606

Patent

active

058703330

ABSTRACT:
A write pulse generating unit for generating write pulses having variable wavelengths is provided. A write pulse having a variable wavelength, generated from the write pulse generating unit, is supplied to a specified transistor memory. Thus, when write pulses, each having a shorter wavelength are supplied to a plurality of transistor memories, variations in read voltage among the transistor memories can be reduced. The write pulse generating unit facilitates identifying transistor memories having degraded retention characteristics upon execution of an accelerated test during baking or burn-in, thereby improving the quality of the memories.

REFERENCES:
patent: 5179535 (1993-01-01), Nakayama
patent: 5243576 (1993-09-01), Ishikawa
patent: 5337282 (1994-08-01), Koike
patent: 5351211 (1994-09-01), Higeta et al.
patent: 5495452 (1996-02-01), Cha
patent: 5748530 (1998-05-01), Gotou et al.

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