Method and system for dividing analyzing region in device simula

Details Method and system for dividing analyzing region in device simula Method and system for dividing analyzing region in device simula

1994-09-16

1997-09-23

Teska, Kevin J.

Boots, shoes, and leggings

395119, 364491, 364578, 36446804, 382154, G06K 946, G06T 1720

Patent

active

056713959

ABSTRACT:
A region of a semiconductor device to be analyzed is initially divided a plurality of fractional elements of predetermined configuration. With respect to each fractional element, adjacent element information is provided. Then, a new nodal point is added. Then, one fractional element having a circumscribed circle enclosing the new nodal point is retrieved. Another fractional elements adjacent the retrieved fractional element and having the circumscribed circle enclosing the new nodal point are retrieved for establishing a fractional element group of the fractional elements having the circumscribed circles enclosing the new nodal point. The fractional elements are established on the basis of the boundary of the fractional element group and the new nodal point. The adjacent element information is then added for respective of the newly established fractional elements.

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Kanaganathan et al., "Comparison of Four-point Adding Algorithms for Delaunay-type Three dimensional Mesh Generators", IEEE May 1991, pp. 3444-3451.
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Yuan et al., "A Mesh Generator for Tetrahedral Elements Using Delaunay Triangulation", IEEE Mar. 1993, pp. 1906-1909.
M.S. Mock, "Tetrahedral Elements and the Scharfetter-Gummel Method", Proceeding of the NASECODE, IV, (1985), pp. 36-47. (month is not available).

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