In-circuit semiconductor tester

Details In-circuit semiconductor tester In-circuit semiconductor tester

1974-10-29

1976-08-03

Rolinec, R. V.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158T, G01R 3122

Patent

active

039731987

ABSTRACT:
An apparatus for testing the junctions of a semiconductor while the semiconductor is in an electrical circuit. The apparatus includes a step-down transformer which operates preferably from a 120 volt AC source. A low voltage secondary winding preferably includes a common lead, a 6.5 volt lead, and a secondary tap lead between the common lead and the 6.5 volt lead. The 6.5 volt lead is connected through a low value resistance to ground. The test leads of the apparatus are connected to the secondary winding of the transformer in such a manner that a low circuit output impedance is maintained at the test leads. Connections to the horizontal and vertical inputs of a conventional oscilloscope or similar apparatus are provided through a voltage divider to the common lead and the tap lead, respectively. In operation, the pattern generated on the face of the oscilloscope in indicative of the condition of the junction of the semiconductor.

REFERENCES:
grant, H. C.; "Zener Diode . . . "; Semiconductor Products; Jan. 1962; pp. 34-37.

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