Method for semiconductor memory testing

Details Method for semiconductor memory testing Method for semiconductor memory testing

1980-08-08

1982-06-15

Atkinson, Charles E.

Excavating

324 73R, 364900, 371 20, 371 21, G01R 3128, G11C 2900

Patent

active

043354572

ABSTRACT:
Semiconductor memory devices are tested by using a special purpose computer which uses simple test patterns to determine the weakest bits of the device and then tests only these relatively few "weak bits" and structurally and operationally adjacent bits using highly complex test patterns to determine if the device is functioning properly. This procedure considerably reduces testing time over that required using prior art techniques.

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Manual Entitled "LSI/VLSI Test System--Sentry VIII", Fairchild Camera & Instrument Corp., 1978, 1979, U.S.A.
Manual Entitled "Mastr Factor", a Programming Language Reference Manual", Fairchild Camera & Instrument Corp., 1979, Feb. 1979 Edition.

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