Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1984-02-17
1986-04-22
McGraw, Vincent P.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356359, G01J 902
Patent
active
045838550
ABSTRACT:
An apparatus is described for measuring spatial phase difference between a signal beam and a reference beam in substantially real time, where the signal and reference beams are coherent beams of optical radiation superimposed upon each other and having orthogonal polarization states with respect to each other.
REFERENCES:
"Instantaneous Phase-Measuring Interferometry: Principles and Recent Advances Reported", Laser Focus/Electro-Optics, pp. 66-70, Oct. 1983.
Smythe et al., "Instantaneous Phase Measuring Interferometry", Proc. SPIE, vol. 429, pp. 16-21, 8/83.
Koren Matthew W.
Lockheed Missiles & Space Company Inc.
McGraw Vincent P.
Morrissey John J.
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