Programmatically generated in-circuit test of digital to analog

Electricity: measuring and testing – Plural – automatically sequential tests

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341120, 371 225, G01R 19257, G01R 3100

Patent

active

048885487

ABSTRACT:
A device and process for programmatically controlled in-circuit pin checks and gross functionality tests of digital to analog converters. The tests provide deterministic bit checks for higher order bits and non-deterministic or "delta" bit checks of low order bits independent of other circuitry on the printed circuit board of which the digital to analog converter is a component.

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