Optics: measuring and testing – Of light reflection
Patent
1993-10-29
1996-05-14
Evans, F. L.
Optics: measuring and testing
Of light reflection
356236, 356346, 356448, G01N 2155, G01J 104, G01B 902
Patent
active
055173152
ABSTRACT:
A reflectometer wherein a light having a predetermined wavelength is projected into an integrating sphere containing a sample whose reflectance is to be measured. As the projected light strikes the sample, rays are reflected back the walls of the integrating sphere; some of which strike the area within the field-of-view of a concentrator. The rays striking within the field-of-view of the concentrator are focused upon a detector element which allows one to determine the reflectance of the sample. A control means is utilized to control the wavelength of the projected light through a spectrophotometer, and calculate the reflectance of the sample.
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Chenault David B.
Hanssen Leonard M.
Schiff Roy
Snail Keith A.
Evans F. L.
Kim Robert
McDonnell Thomas E.
Stockstill Charles J.
The United States of America as represented by the Secretary of
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