Post-CMP wafer clean process

Cleaning and liquid contact with solids – Processes – Including application of electrical radiant or wave energy...

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Details

510175, 510176, B08B 600, C11D 904

Patent

active

060241063

ABSTRACT:
A post-CMP wafer clean process. A post-CMP wafer is provided. A portion of particles and slurry are removed from the wafer by double side scrubber. The residual particles and slurry are then removed from the wafer in a solvent tank by magasonic and a solvent in the solvent tank includes an amine-based compound.

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