Method of making a high breakdown active device structure with l

Fishing – trapping – and vermin destroying

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437156, 437917, 148DIG85, 148DIG126, 148DIG167, H01L 2122

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050913360

ABSTRACT:
Series resistance in the low impurity portion of a high breakdown PN junction of a three or four layer device is reduced by providing an increased inpurity region at the junction of the same conductivity type as the low impurity portion and having an impurity profile such that the increased impurity region is depleted under reverse biasing before critical field is reached therein. The three layer devices include insulated gate field effect transistors and bipolar devices and the four layer device is a semiconductor controlled rectifier (SCR).

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