Method of and photometric arrangement for measuring and controll

Details Method of and photometric arrangement for measuring and controll Method of and photometric arrangement for measuring and controll

1982-08-25

1984-09-04

Morgenstern, Norman

Coating processes

Measuring, testing, or indicating

Thickness or uniformity of thickness determined

356281, 356282, 356 4, 427 8, G05D 503, G05F 166, B05D 100

Patent

active

044697139

ABSTRACT:
An arrangement for measuring and controlling the thickness of optically transparent coatings during their build-up on substrates in vacuum coating installations. The measurement is carried out by determining at least one reference value and at least one measured value for the transmission or reflection value of the coated object by using a measuring light beam, a monochromator, a photo-receiver, an amplifier and an analyzing circuit.

REFERENCES:
patent: 3773548 (1973-11-01), Baker et al.
patent: 4024291 (1977-05-01), Wilmanns
patent: 4068016 (1978-01-01), Wilmanns

Affiliated with

Also associated with

Rating

Method of and photometric arrangement for measuring and controll does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of and photometric arrangement for measuring and controll, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of and photometric arrangement for measuring and controll will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1892005