Standard- and limited-access hybrid test fixture

Details Standard- and limited-access hybrid test fixture Standard- and limited-access hybrid test fixture

1996-10-29

1998-06-30

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324758, G01R 3102

Patent

active

057739889

ABSTRACT:
A hybrid test fixture is described that utilizes long, leaning or vertical test probes, guide plates and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited-access, no-clean test targets. The hybrid test fixture of the present invention also utilizes standard spring probes and long wirewrap posts or long wirewrap wires in order to probe standard-access test targets. The hybrid test fixture of the present invention also utilizes spring probes, a probe-mounting plate, personality pins and an alignment plate in order to couple test targets with multiplexed tester resources. Accordingly, the hybrid test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board containing both standard-access and limited-access, no-clean test targets. The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets, while at the same time capable of probing of standard-access test targets.

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patent: 5506510 (1996-04-01), Blumenau
patent: 5510722 (1996-04-01), Seavey

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