Method and apparatus for testing integrated circuits

Details Method and apparatus for testing integrated circuits Method and apparatus for testing integrated circuits

1996-08-26

1998-05-19

Beausoliel, Jr., Robert W.

Excavating

39518301, G01R 3128

Patent

active

057545596

ABSTRACT:
A test system for use with an automatic testing equipment to test a large number of integrated circuits simultaneously. The test system comprises a plurality of logical circuits for simultaneously combining the signals from like output lines of the integrated circuits being tested. The logical circuits substantially reduce the number of the signals and therefore remove the limitation of the number of the input/output channels on the automatic testing equipment and allows the simultaneously testing of a large number of integrated circuits.

REFERENCES:
patent: 4906862 (1990-03-01), Itano et al.
patent: 5019772 (1991-05-01), Dreibelbis et al.
patent: 5155704 (1992-10-01), Walther et al.
patent: 5212442 (1993-05-01), O'Toole et al.
patent: 5231605 (1993-07-01), Lee
patent: 5245577 (1993-09-01), Duesman et al.
patent: 5248075 (1993-09-01), Young et al.
patent: 5279975 (1994-01-01), Devereaux et al.
patent: 5339320 (1994-08-01), Fandrich et al.
patent: 5348164 (1994-09-01), Heppler
patent: 5367263 (1994-11-01), Ueda et al.
patent: 5373472 (1994-12-01), Ohsawa
patent: 5384533 (1995-01-01), Tokuda et al.
patent: 5384741 (1995-01-01), Haragucyhi
patent: 5391892 (1995-02-01), Devereaux et al.
patent: 5397908 (1995-03-01), Dennison et al.
patent: 5420869 (1995-05-01), Hatakeyama
patent: 5426649 (1995-06-01), Blecha
patent: 5440241 (1995-08-01), King et al.
patent: 5440517 (1995-08-01), Morgan et al.
patent: 5442642 (1995-08-01), Ingalla et al.
patent: 5450362 (1995-09-01), Matsuzaki
patent: 5452253 (1995-09-01), Choi
patent: 5457400 (1995-10-01), Ahmad et al.
patent: 5467468 (1995-11-01), Koshikawa
patent: 5469393 (1995-11-01), Thomann
patent: 5475330 (1995-12-01), Watanabe et al.
patent: 5488583 (1996-01-01), Ong et al.
patent: 5526364 (1996-06-01), Roohparvar
patent: 5528162 (1996-06-01), Sato
patent: 5528603 (1996-06-01), Canella et al.
patent: 5541935 (1996-07-01), Waterson
patent: 5544108 (1996-08-01), Thomann

Affiliated with

Also associated with

Rating

Method and apparatus for testing integrated circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for testing integrated circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for testing integrated circuits will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1860686