Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1992-10-26
1998-05-19
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
356353, G01B 902
Patent
active
057542929
ABSTRACT:
The pulse shape I(t) and phase evolution x(t) of ultrashort light pulses are obtained using an instantaneously responding nonlinear optical medium to form a signal pulse. A light pulse, such a laser pulse, is split into a gate pulse and a probe pulse, where the gate pulse is delayed relative to the probe pulse. The gate pulse and the probe pulse are combined within an instantaneously responding optical medium to form a signal pulse functionally related to a temporal slice of the gate pulse corresponding to the time delay of the probe pulse. The signal pulse is then input to a wavelength-selective device to output pulse field information comprising intensity vs. frequency for a first value of the time delay. The time delay is varied over a range of values effective to yield an intensity plot of signal intensity vs. wavelength and delay. In one embodiment, the beams are overlapped at an angle so that a selected range of delay times is within the intersection to produce a simultaneous output over the time delays of interest.
REFERENCES:
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Kane Daniel J.
Trebino Rick P.
Sandia National Laboratory
The Regents of the University of California
Turner Samuel A.
Wilson Ray G.
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