Probe for an extensometer

Details Probe for an extensometer Probe for an extensometer

1990-12-24

1992-01-28

Myracle, Jerry W.

Measuring and testing

Specimen stress or strain, or testing by stress or strain...

By loading of specimen

33790, G01B 530

Patent

active

050834657

ABSTRACT:
Disclosed herein are probes for mounting on an extensometer used in conjunction with a materials testing machine, and can be used in high temperature applications. Each probe includes a probe shaft with a tip and a probe support body mounted to a hollow shield tube over the probe shaft. The probe support body includes a tipped segment which is biased toward the tip of the probe shaft. A longitudinal axis passes through the tips and tipped segment, respectively. The hollow shield tube mounted over the probe shaft is made of a high temperature material having a low thermal conductivity coefficient. The sleeve prevents excessive temperature transients from affecting the probe shaft.

REFERENCES:
patent: 608012 (1898-07-01), Stirckler
patent: 3319338 (1967-05-01), DeNicola

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