Rigid-flex circuits with raised features as IC test probes

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324 725, 324158F, G01R 1073

Patent

active

052647870

ABSTRACT:
A circuit testing fixture is provided in which a flexible membrane (17) is provided with raised features (25) on one side arranged in the pattern of contacts (65) on a device (63) to be tested and circuit means (26) connected to a probe card (12). On the opposite side of the membrane is a support form (58), (66), (70) that is clamped in position so that it acts as a pressure pad to deflect the membrane outwardly. The support form has a planar bottom edge which may provide ridges (61) in back of the raised features (25) on the membrane (17) or recesses (68) at that location. The support form also may have a flat bottom surface (71) and may be of soft compliant material or of rigid material.

REFERENCES:
patent: 4891585 (1990-01-01), Janko et al.
patent: 4918383 (1990-04-01), Huff et al.
patent: 4975638 (1990-12-01), Evans et al.
patent: 4980637 (1990-12-01), Huff et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Rigid-flex circuits with raised features as IC test probes does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Rigid-flex circuits with raised features as IC test probes, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Rigid-flex circuits with raised features as IC test probes will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1852152

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.