Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Patent
1999-10-07
2000-05-23
Assouad, Patrick
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
374117, 374141, G01K 700
Patent
active
06067508&
ABSTRACT:
A method is described for measuring localized operating temperatures and voltages on an integrated circuit. The integrated circuit includes an oscillator circuit with a frequency that varies with temperature and/or applied voltage. The frequency of the oscillator is then determined, using a constant voltage, for a number of temperatures to establish a known relationship between oscillation frequency and temperature. Once the relationship is known, a similar oscillator is included within or adjacent a second circuit of the integrated circuit. The operating temperature or operating voltage of the second circuit may then be determined by monitoring the frequency of the oscillator while the second circuit is operational.
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"The Programmable Logic Data Book," (1994), available from Xilinx, 2100 Logic Drive, San Jose, California, Chapters 7 and 8.
Assouad Patrick
Behiel Arthur J.
Harms Jeanett S.
Xilinx , Inc.
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