Potential detecting circuit for determining whether a detected p

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – With specific source of supply or bias voltage

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327537, 327546, 36518909, G05F 326, G05F 1575

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active

058475974

ABSTRACT:
A potential detecting circuit includes an output node, a reference current supplying circuit for supplying a prescribed reference current to the output node, a detection node to which the potential to be detected is applied, and a comparing current supplying circuit, responsive to the potential applied to the detection node, for supplying a comparing current to the output node. The comparing current supplying circuit includes a detection resistance element through which a detection current flows in response to the potential applied to the detection node, and a current mirror circuit responsive to the detection current for controlling supplying the comparing current. When the potential applied to the detection node attains the prescribed detection level, an additional current supplying circuit supplies an addition current to the output node in addition to the comparing current.

REFERENCES:
patent: 4670706 (1987-06-01), Tobita
patent: 4706011 (1987-11-01), Vergara et al.
patent: 4788455 (1988-11-01), Mori et al.
patent: 4994688 (1991-02-01), Horiguchi et al.
patent: 5034625 (1991-07-01), Min et al.
patent: 5059890 (1991-10-01), Yoshikawa et al.
patent: 5191235 (1993-03-01), Hara
patent: 5202587 (1993-04-01), McLaury
patent: 5227675 (1993-07-01), Taguchi
patent: 5262989 (1993-11-01), Lee et al.
patent: 5270591 (1993-12-01), Ross
patent: 5341340 (1994-08-01), Hagura
patent: 5347170 (1994-09-01), Hayakawa et al.
patent: 5382839 (1995-01-01), Shinohara
patent: 5394026 (1995-02-01), Yu et al.
patent: 5414669 (1995-05-01), Tedrow et al.
patent: 5436552 (1995-07-01), Kajimoto
patent: 5446418 (1995-08-01), Hara et al.
patent: 5451891 (1995-09-01), Tanabe
patent: 5463333 (1995-10-01), Calder et al.
patent: 5467050 (1995-11-01), Clapp, III et al.
patent: 5510749 (1996-04-01), Arimoto
"CMOS Analog Integrated Circuits Based on Weak Inversion Operation", Vittoz et al., IEEE Journal of Solid State Circuits, vol. SC-12, No. 3, Jun. 1977, pp. 224-231.
"An Experimental 1.5-V 64-Mb DRAM", Nakagome et al., IEEE Journal of Solid-State Circuits, vol. 26, No. 4, Apr. 1991, pp. 465-472.

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