Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1989-09-29
1992-02-18
Willis, Davis L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356305, 356334, G01J 328, G01J 340, G01J 318
Patent
active
050888234
ABSTRACT:
A spectroanalytical system includes entrance aperture defining structure for receiving radiation to be analyzed along a first path; collimating structure in the first path for providing collimated radiation along a second path; fixed refraction structure in the second path for spatially separating (refracting) radiation in the second path in a first direction as a function of wavelength; fixed echelle grating structure in the second path for spatially separating the refracted radiation as a function of wavelength in a second direction orthogonal to the first direction and directing the orthogonally dispersed radiation in a beam along a third path that does not pass through the first refraction structure; and two-dimensional array detector structure for detecting the beam of orthogonally refracted radiation.
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Schleicher Robert G.
Smith, Jr. Stanley B.
Hantis K. P.
Thermo Jarrell Ash Corporation
Willis Davis L.
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