Non-destructive testing of a laminated ceramic capacitor

Details Non-destructive testing of a laminated ceramic capacitor Non-destructive testing of a laminated ceramic capacitor

1980-07-23

1982-08-17

Ciarlante, Anthony V.

Measuring and testing

Vibration

By mechanical waves

73801, G01N 2904

Patent

active

043443265

ABSTRACT:
This disclosure is directed to techniques for proof testing a laminated ceramic capacitor chip (10) by placing the capacitor on a planar base (26) and applying a load thereto in a direction perpendicular to the laminations. The load is applied by a compliant ram (27) and acoustic emissions emanating from the capacitor (10) pass through the ram to a transducer (28) mounted thereon. The acoustic emissions are converted to electrical signals by the transducer (28) and are forwarded to processing circuitry (29) to compare the acoustic emission signals to previously developed signals from stressed physically acceptable capacitors (10) to determine the acceptability thereof.

REFERENCES:
patent: 3593048 (1971-07-01), Dunegan et al.
patent: 3919883 (1975-11-01), Nakamura et al.
patent: 3924456 (1975-12-01), Vahaviolos
patent: 4075886 (1978-02-01), Barker
patent: 4086817 (1978-05-01), Jon et al.
"Real Time Detection of Microcracks in Brittle Materials Using Stress Wave Emission (SWE)," IEEE Transactions on Parts, Hybrids, and Packaging, vol. PHP-10, No. 3, Sep. 1974, pp. 152-159.
"Western Electric Reports: Listening to the Cry of Materials Under Stress," IEEE Spectrum, May, 1975, p. 19.
"Forecasting Failures with Acoustic Emission," Machine Design, Jun. 14, 1973, pp. 132-137.
"Stress Wave Emission: Defining Its Capabilities," Metals and Materials, Mar.1976, pp. 35-37.

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