Method and apparatus for probing large pin count integrated circ

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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324758, 324765, G01R 3128

Patent

active

059492384

ABSTRACT:
A probing apparatus for probing a large pin count integrated circuit mounted on a circuit board is disclosed. The probing apparatus uses a mounting block and an interconnecting probe body to provide proper alignment of the probing apparatus to pins or pads of the integrated circuit. Since the probing apparatus can be connected while the integrated circuit to be tested is powered up and operational, the probing apparatus facilitates testing of the integrated circuit in real-time. A method for probing a large pin count integrated circuit is also disclosed.

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