Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-12-20
1999-09-07
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324758, 324765, G01R 3128
Patent
active
059492384
ABSTRACT:
A probing apparatus for probing a large pin count integrated circuit mounted on a circuit board is disclosed. The probing apparatus uses a mounting block and an interconnecting probe body to provide proper alignment of the probing apparatus to pins or pads of the integrated circuit. Since the probing apparatus can be connected while the integrated circuit to be tested is powered up and operational, the probing apparatus facilitates testing of the integrated circuit in real-time. A method for probing a large pin count integrated circuit is also disclosed.
REFERENCES:
patent: 3968433 (1976-07-01), Dobarganes
patent: 4352061 (1982-09-01), Matrone
patent: 4541676 (1985-09-01), Hansen et al.
patent: 4671590 (1987-06-01), Ignasiak
patent: 4768972 (1988-09-01), Ignasiak et al.
patent: 4771234 (1988-09-01), Cook et al.
patent: 4814697 (1989-03-01), Kruger
patent: 4904935 (1990-02-01), Calma et al.
patent: 4967147 (1990-10-01), Woods, Jr. et al.
patent: 4996476 (1991-02-01), Balyasny et al.
patent: 5134365 (1992-07-01), Okubo et al.
patent: 5204615 (1993-04-01), Richards et al.
patent: 5205741 (1993-04-01), Steen et al.
patent: 5339027 (1994-08-01), Woith et al.
patent: 5355079 (1994-10-01), Evans et al.
patent: 5376882 (1994-12-01), Johnson
patent: 5415560 (1995-05-01), Balyasny
patent: 5436571 (1995-07-01), Karasawa
Nguyen Vinh P.
Siemens Medical Systems Inc.
LandOfFree
Method and apparatus for probing large pin count integrated circ does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for probing large pin count integrated circ, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for probing large pin count integrated circ will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1807613