MeV scanning ions implanter

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250251, H05H 504

Patent

active

057194033

ABSTRACT:
A method and apparatus for the direct current acceleration and scanning of ions of all species to energies as high as a few million electron volts (MeV). These method and apparatus have particular relevance for the controlled doping of semiconductor materials and flat panel display units. The apparatus employs high velocity neutral beams of dopant atoms to deliver atoms to the high voltage terminal where they are converted to positive ions having a low electric rigidity. This low electric rigidity makes possible a compact charge state analyzer prior to final positive ion acceleration together with compact electrostatic scanning of the ions for individual wafer implantation at MeV energies. This technology makes possible a compact implanter system.

REFERENCES:
patent: 3136908 (1964-06-01), Weinman
patent: 5300891 (1994-04-01), Tokoro
Nuclear Instruments and Methods in Physics Research B55 (1991) 434-438; N. Tokoro, et al.; "The beam performance of the Genus G-1500 ion implanter".
Atomic Data vol. 5, No. 2, 1973; A.B. Wittkower et al.; "Equilibrium-charge-state distributions of Energentic Ions (Z>2) in gaseous and solid media", pp. 133-136.
Nuclear Instruments and Methods 8 (1960) 195-202; VandeGraaf; "Tandem Electrostatic Accelerators".
Reprinted from Nature, vol. 195, No.4848, pp. 1292-1293, Sep. 29, 1962; Van de Graaf, et al.; "High-Voltage acceleration tubes utilizing inclined-field principles".
Reprinted from The Review of Scientific Instruments, vol. 36, No. 4, 453-457, Apr. 1965; Purser, et al. "Properties of Inclined-Field Acceleration Tubes".
Nuclear Instruments and Methods in Physics Research B21 (1987) 334-338; John P. O'Connor et al.; "A High Current Injector For Tandem Accelerators".
Nuclear Instruments and Methods in Physics Research B21 91987) 285-295; Norman Turner, et al.; "Design Considerations of a VLSI Compatible Production MeV Ion Implantation System".
Nuclear Instruments and Methods in Physics Research B21 (1987) 264-269; H.F. Glavish, et al.; "Production High Energy Ion Implanters Using Radio Requency Acceleration".

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

MeV scanning ions implanter does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with MeV scanning ions implanter, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and MeV scanning ions implanter will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1786079

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.