Method of generating and transmitting digitally distorted test s

Details Method of generating and transmitting digitally distorted test s Method of generating and transmitting digitally distorted test s

1988-07-21

1990-02-27

Gruber, Felix D.

Boots, shoes, and leggings

371 20, 371 27, G06F 706, G06F 309

Patent

active

049051725

ABSTRACT:
A microprocessor controlled test system generates and transmits distorted digital signals to a system under test by expanding a bit pattern, representative of a character to be transmitted, by an integer multiple of expansion. Selected bits of the expanded bit pattern are toggled from one logic level to another under program control to produce a distorted expanded bit pattern. The distorted expanded bit pattern is clocked out of the test system to the system under test at a rate equal to the integer multiple of expansion times the baud rate of the system under test. The resolution of the test signal can be varied by changing the integer multiple of expansion along with the rate at which the test signal is clocked out of the test system. The invention is useful in testing and adjusting a teletypewriter.

REFERENCES:
patent: 3526713 (1966-06-01), Elvis et al.
patent: 4538268 (1985-08-01), Van Cang
patent: 4656428 (1987-04-01), Ishikawa
patent: 4692920 (1987-09-01), Tannhaeuser et al.
Stelma Communications PG-303 Pattern Technical Manual, pp. 29-52.
Tektronix, Inc. 834 Progammable Data Communications (Tester Instruction Manual, pp. 4-1 to 4-2 and Block Diagram).
"Circuit for Forming Test Message for Testing Serial Data Link" IBM Technical Disclosure Bulletin, Aug. 1983, vol. 28, No. 3, p. 1012.
Tektronix, Inc. 835/836 Programmable Data Communications (Tester Instruction Manual, pp. 13-1 to 13-2 and Block Diagram).
Tektronix, Inc. 834R03A Link Test ROM Pack (pp. 2-1 to 2-8).

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