Materials testing apparatus for reduced sample bending

Details Materials testing apparatus for reduced sample bending Materials testing apparatus for reduced sample bending

1993-09-01

1994-11-08

Noland, Thomas P.

Measuring and testing

Specimen stress or strain, or testing by stress or strain...

By loading of specimen

73853, 73856, 33790, G01N 308, G01N 320

Patent

active

053616405

ABSTRACT:
A material testing apparatus is shown that uses one free swiveling alignment coupling and one alignment coupling which can be used in a free swiveling mode or a fixed alignment mode. These couplings and an alignment extensiometer are used to reduce sample bending. First and second pull rods (4,8) removably connected to the alignment couplings (5,9) are at opposite ends thereof removably coupled to the sample (1) being tested via sample couplings (3,7).

REFERENCES:
patent: 2454850 (1948-11-01), Winkle et al.
patent: 3005336 (1961-10-01), Wyman
patent: 3107524 (1963-10-01), O'Connor
patent: 4686860 (1987-08-01), Liu
patent: 4845997 (1989-07-01), Radin et al.
patent: 4914543 (1990-04-01), Carroll et al.
patent: 5138887 (1992-08-01), Pohl
patent: 5279166 (1994-01-01), Ward et al.
"Series 4100 Metals Testing Extensometers" pp. 4-6 dated by Aug. 1993 & 2 pages dated Jan. 1991 by Applied Test Systems Inc.
P. 15 "Coupling" (Refer to Bulletin 4030, presumably of Applied Test Systems, Inc.) published by Aug. 1993.

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