Micro-coded built-in self-test apparatus for a memory array

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371 212, 371 151, G11C 2900, G06F 1100

Patent

active

052241017

ABSTRACT:
A built-in self-test apparatus for a memory cell array having a micro-code sequencer to receive and utilize micro-instruction from a read only memory. The micro-code sequencer applies test algorithms to each cell of the memory cell array and detects the responses to determine the operational status of the memory cell array.

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patent: 4667330 (1987-05-01), Kumagai
patent: 4752929 (1988-06-01), Kantz et al.
patent: 4823307 (1989-04-01), Melgara et al.
patent: 4912710 (1990-03-01), Rolfe
patent: 5073891 (1991-12-01), Patel

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