Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1988-11-07
1990-02-27
Pellinen, A. D.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324554, G01R 2702
Patent
active
049049461
ABSTRACT:
A test method is used for examining a sample insulating film to determine an expected value of time for the sample insulating film to undergo dielectric breakdown. A varying electric stress is applied to a sample insulating film to flow therethrough a varying electric current. The varying electric current is monitored until catastrophic dielectric breakdown occurs in the sample insulating film to measure a critical electric current which flows through the sample insulating film immediately before the breakdown occurs. The expected value of time to breakdown is determined according to the measured critical electric current.
REFERENCES:
patent: 3125720 (1964-03-01), Swift
patent: 3727129 (1973-04-01), Hummert
patent: 4336494 (1982-06-01), Shindo et al.
patent: 4360774 (1982-11-01), Crytzer
patent: 4810972 (1989-03-01), Appleby, Jr. et al.
"Time-Zero Dielectric Reliability Test By a Ramp Method" IEEE/IRPS, 1981, by Arnold Berman, pp. 204-209.
"Method of Determining Reliability Screens For Time Dependent Dielectric Breakdown", IEEE/IRPS, 1979, by Dwight L. Crook, pp. 1-7.
"IBM Technical Disclosure Bulletin", vol. 28, No. 5, Oct. 1985.
"IEEE 17th Annual Proceedings Reliability Physics", San Francisco, Calif., 1979, pp. 8-12, Low Field Time Dependent Dielectric Integrity.
Adams Bruce L.
Gaffin Jeffrey A.
Pellinen A. D.
Seiko Instruments Inc.
Wilks Van C.
LandOfFree
Method for evaluating insulating films does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for evaluating insulating films, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for evaluating insulating films will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-176045