Predicting register mark position with data shifting and coincid

Details Predicting register mark position with data shifting and coincid Predicting register mark position with data shifting and coincid

Filed on

1991-12-02

Date issued

1993-06-29

Examiner

Nelms, David C.

Patent Class

Radiant energy

SubClass

Photocells; circuits and apparatus

SubSubClass

Photocell controls its own optical systems

Other Related Categories

250557, G01N 2186

Type

Patent

Status

active

Patent number

052237206

Description

ABSTRACT:
A method and apparatus for predicting the position of a register mark within an image on an elongate web relative to a reference position of the mark when the image is at a reference position is described. The apparatus includes a detector for obtaining successive samples of the image; a comparator for comparing the samples with a reference threshold so as to generate a binary sequence; and a comparator for comparing the binary sequence with a reference sequence. The apparatus is operable to carry out a series of comparisons between the two sequences with the sequences offset by successive one bit intervals and at each offset position, the number of coincidences between binary values is summed by counters. The resultant sums are then compared and the highest is taken to indicate the degree of offset between the two sequences and is used to predict that the register mark has the same offset.

REFERENCES:
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patent: 4435835 (1984-03-01), Sakow et al.
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patent: 4665318 (1987-05-01), Toda et al.
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patent: 4719575 (1988-01-01), Gnuechtel
patent: 4864631 (1989-09-01), Jensen
patent: 4972088 (1990-11-01), Weyer et al.
Patent Abstracts of Japan, vol. 004-040, Mar. 28, 1980, Publication No. 55011343, Arimura Yoshiaki, application No. 53083844.
Japanese Patent No. 59-101366 (Abstract, Atsushi Katada, Jun. 11, 1984.

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