Semiconductor integrated circuit device incorporating fuse-progr

Details Semiconductor integrated circuit device incorporating fuse-progr Semiconductor integrated circuit device incorporating fuse-progr

1997-04-01

1998-06-16

Canney, Vincent P.

Excavating

G06F 1100

Patent

active

057682909

ABSTRACT:
A semiconductor integrated circuit device includes a test mode circuit for generating a fuse blow test mode activation signal according to a signal applied to a predetermined terminal, a pass/fail confirmation circuit including a fuse element and providing a signal of a logic level according to a conduction
on-conduction state of this fuse element when the fuse blow test mode activation signal from the test mode circuit is active, and an output conversion circuit for converting an output signal of the pass/fail confirmation circuit into a signal observable at a predetermined external terminal. The fuse element included in the pass/fail confirmation circuit is blown out by a laser only when the semiconductor integrated circuit device is determined to be an acceptable product at the test of the wafer level. After packaging, determination of whether there is a cut off failure in any internal fuse element can easily be made in non-destructive manner.

REFERENCES:
patent: 4896055 (1990-01-01), Fujii et al.
patent: 5617366 (1997-04-01), Yoo

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