Method of electrically testing active matrix substrate

Details Method of electrically testing active matrix substrate Method of electrically testing active matrix substrate

1988-10-14

1990-07-10

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158T, 357 45, G01R 3102, G01R 3128

Patent

active

049409344

ABSTRACT:
In a method of electrically testing an active matrix substrate having a plurality of semiconductor switching devices, a row group of a plurality of parallel conductors and a column group of a plurality of parallel conductors, a gate electrode of each of the semiconductor switching devices being connected to one of the conductors of the row group, and a source electrode of each of the semiconductor switching devices being connected to one of the conductors of the column group, there are provided the steps of short-circuiting the conductors of the row group at both ends thereof; short-circuiting the conductors of the column group at both ends thereof; applying a predetermined voltage between the row and column groups of the conductors; and measuring a current flowing from the row group to the column group of the conductors. Moreover, in determining whether the active matrix substrate is defective, there is also provided the step of determining whether the following formula is satisfied or not:

REFERENCES:
patent: 3988672 (1976-10-01), Cowart
patent: 4631724 (1986-12-01), Shimizu
patent: 4647846 (1987-03-01), Malkin
patent: 4713607 (1987-12-01), Pepper
patent: 4731759 (1988-03-01), Watanabe
patent: 4779272 (1988-10-01), Kohda et al.

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