Method of improving the quality and efficiency of Iddq testing

Details Method of improving the quality and efficiency of Iddq testing Method of improving the quality and efficiency of Iddq testing

1997-04-29

1999-06-22

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 731, G01R 3126

Patent

active

059146150

ABSTRACT:
A method of detecting defects within an integrated circuit. Iddq testing for defects within integrated circuits includes measuring the quiescent (Iddq) current conducted by power supply nodes of the integrated circuit which are connected to a power supply while controlling signal levels of a plurality of inputs to the integrated circuit. The method of this invention includes calculating an upper threshold Iddq value and a lower threshold Iddq value. The input nodes are driven to a predetermined combination of input voltages and a corresponding Iddq value is measured. It is determined whether the measured Iddq value is between the upper threshold Iddq value and the lower threshold Iddq value. Another embodiment of this invention includes the upper and lower threshold values being dependent on a measured mean value of Iddq for the integrated circuit.

REFERENCES:
patent: 5025344 (1991-06-01), Maly et al.
patent: 5332973 (1994-07-01), Brown et al.
patent: 5670892 (1997-09-01), Sporck

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