Self-testing microprocessor with microinstruction substitution

Details Self-testing microprocessor with microinstruction substitution Self-testing microprocessor with microinstruction substitution

1990-05-31

1993-07-06

Lee, Thomas C.

Excavating

395375, 371 161, 371 151, 3649449, 364DIG1, 3642566, G06F 1100

Patent

active

052261492

ABSTRACT:
A microprocessor having a test mode wherein a test instruction including an instruction for executing a diagnosing microprogram routine which tests each function block inside of the microprocessor and an instruction which makes data scan in to various latches such as a latch at output portion of the micro ROM for easily diagnosing each internal function blocks by independently operating them, and the latch at the output portion of the micro ROM is allocated an address and is constituted to be loaded in and to store the data from outside of the microprocessor. A diagnosing instruction is loaded from the outside of the microprocessor and the microinstruction of an address allocated the latch is executed, thereby the cause of a fault in the microprocessor can be easily diagnosed.

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"Testing Approaches in the MC68020", Kuban, et al., Motorola, Inc., VLSI Design, Nov. 1984, pp. 22-30.

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