Method of producing clear potential contrast image through scann

Image analysis – Applications – Manufacturing or product inspection

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324751, 250310, G06K 900, G01N 2300, G01R 31305

Patent

active

059956470

ABSTRACT:
An electron pulse signal is repeatedly radiated on a target spot applied with a certain potential for measuring a variation of secondary electron intensity, and a discrete value is assigned to each variation between the two secondary electron intensities so as to eliminate an electrical influence of an insulating passivation layer over the target spot from a potential contrast image.

REFERENCES:
patent: 4996659 (1991-02-01), Yamaguchi et al.
patent: 5521517 (1996-05-01), Shida et al.
patent: 5528156 (1996-06-01), Ueda et al.
Patent Abstracts of Japan, vol. 008, No. 213(E-269), Sep. 28, 1984, referencing JP 59099731, Jun. 8, 1984.
Patent Abstracts of Japan, vol. 95, No. 007, Aug. 31, 1995, referencing JP 07092238, Apr. 7, 1995.
"10.4. Design for Electron Beam Testability and Specimen Preparation", T.J. Alon et al., Electron Beam Testing Technology, 1993, pp. 410-415.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of producing clear potential contrast image through scann does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of producing clear potential contrast image through scann, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of producing clear potential contrast image through scann will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1683822

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.