Method of making trench-incorporated monolithic semiconductor ca

Fishing – trapping – and vermin destroying

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437 67, 437 31, 437249, 437919, H01L 21302, H01L 2176, H01L 2170

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active

047043687

ABSTRACT:
A high density integrated circuit structure, for example a dynamic memory cell, is described which includes an active/passive device in combination with a capacitor structure. The capacitor structure is of the polysilicon-oxide-silicon type and is formed on the sidewalls of a mesa-shaped and dielectrically isolated region of silicon material resulting from the formation of an isolation trench in the silicon. The trench is filled with a plastic material, such as polyimide. The capacitor is formed by the isolated region of silicon material which functions as the first capacitor plate, a doped polysilicon layer provided on the vertical walls of the mesa serving as the second capacitor plate and a thin dielectric layer interposed between the two plates serving as the capacitor's dielectric. Since the polysilicon is wrapped around the periphery of the mesa as a coating on the vertical sidewalls thereof, it gives rise to a large storage capacitance without an increase in the cell size.

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C. G. Jambotkar, "Very Dense One-Device Fet Memory Cell", IBM Technical Disclosure Bulletin, vol. 25, No. 2, Jul. 1982, pp. 593-596.

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