Method to analyze particle contaminants in compressed gases

Details Method to analyze particle contaminants in compressed gases Method to analyze particle contaminants in compressed gases

1997-05-29

1999-11-30

Williams, Hezron

Measuring and testing

Gas analysis

Solid content of gas

73 3103, 738655, G01N 100

Patent

active

059922168

ABSTRACT:
A system and a method for analyzing impurities in compressed gas, a method for controlling the particle growth in the monitored gas and a method for determining the optimum monitoring temperature for an individual gas are disclosed.

REFERENCES:
patent: 3892549 (1975-07-01), Lyschkow
patent: 4154088 (1979-05-01), Werner
patent: 4704804 (1987-11-01), Wyatt et al.
patent: 4878510 (1989-11-01), Kaspar et al.
patent: 4912985 (1990-04-01), Daum et al.
patent: 4964278 (1990-10-01), Wen et al.
patent: 5026155 (1991-06-01), Ockovic et al.
patent: 5027642 (1991-07-01), Wen et al.
patent: 5101671 (1992-04-01), Elgas
patent: 5190726 (1993-03-01), Shinoke et al.
patent: 5209102 (1993-05-01), Wang et al.
patent: 5214952 (1993-06-01), Leggett et al.
patent: 5519490 (1996-05-01), Nakata et al.
patent: 5673562 (1997-10-01), Friedt

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