Extended drain self-aligned silicon gate MOSFET

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

357 4, 357 59, H01L 2978

Patent

active

042323274

ABSTRACT:
A Metal-Oxide-Semiconductor-Field Effect Transistor (MOSFET) is described wherein a body of semiconductor material is provided with source, drain and channel regions. A gate structure is provided over the interstitial channel region of the semiconductor body between the drain and source regions, one edge of which is aligned with the source region. The remainder of the channel region, between the other edge of the gate structure and the adjacent edge of the drain region is provided with a drift region of a conductivity type that is opposite to that of the source and drain.

REFERENCES:
patent: 3296508 (1967-01-01), Hofstein
patent: 3339128 (1967-08-01), Olmsted
patent: 3434021 (1969-03-01), Hofstein
patent: 3455020 (1969-07-01), Dawson
patent: 3484662 (1969-12-01), Hogan
patent: 3633078 (1972-01-01), Dill
patent: 3719866 (1973-03-01), Naber
patent: 3738880 (1973-06-01), Laher
patent: 3855610 (1974-12-01), Masuda
patent: 3988761 (1976-10-01), Kanazawa
patent: 4193080 (1980-03-01), Koike

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Extended drain self-aligned silicon gate MOSFET does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Extended drain self-aligned silicon gate MOSFET, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Extended drain self-aligned silicon gate MOSFET will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1648098

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.