Patent
1978-11-13
1980-11-04
Edlow, Martin H.
357 4, 357 59, H01L 2978
Patent
active
042323274
ABSTRACT:
A Metal-Oxide-Semiconductor-Field Effect Transistor (MOSFET) is described wherein a body of semiconductor material is provided with source, drain and channel regions. A gate structure is provided over the interstitial channel region of the semiconductor body between the drain and source regions, one edge of which is aligned with the source region. The remainder of the channel region, between the other edge of the gate structure and the adjacent edge of the drain region is provided with a drift region of a conductivity type that is opposite to that of the source and drain.
REFERENCES:
patent: 3296508 (1967-01-01), Hofstein
patent: 3339128 (1967-08-01), Olmsted
patent: 3434021 (1969-03-01), Hofstein
patent: 3455020 (1969-07-01), Dawson
patent: 3484662 (1969-12-01), Hogan
patent: 3633078 (1972-01-01), Dill
patent: 3719866 (1973-03-01), Naber
patent: 3738880 (1973-06-01), Laher
patent: 3855610 (1974-12-01), Masuda
patent: 3988761 (1976-10-01), Kanazawa
patent: 4193080 (1980-03-01), Koike
Benjamin Lawrence P.
Cohen D. S.
Edlow Martin H.
Morris Birgit E.
RCA Corporation
LandOfFree
Extended drain self-aligned silicon gate MOSFET does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Extended drain self-aligned silicon gate MOSFET, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Extended drain self-aligned silicon gate MOSFET will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1648098