Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates
Patent
1999-09-03
2000-11-07
Niebling, John F.
Semiconductor device manufacturing: process
Bonding of plural semiconductor substrates
438455, 438456, 438457, 438458, 438459, 438460, 438149, 438150, 438151, 438152, 438153, 438154, 438155, 257758, H01L 2130
Patent
active
061436291
ABSTRACT:
In a process for producing a semiconductor substrate, comprising sealing surface pores of a porous silicon layer and thereafter forming a single-crystal layer on the porous silicon layer by epitaxial growth, intermediate heat treatment is carried out after the sealing and before the epitaxial growth and at a temperature higher than the temperature at the time of the sealing. This process improves crystal quality of the semiconductor substrate having the single-crystal layer formed by epitaxial growth and improves smoothness at the bonding interface when applied to bonded wafers this process enables the detection of the smaller particles on the surface by a laser light scattering method.
REFERENCES:
patent: 4933255 (1990-06-01), Hata et al.
patent: 5371037 (1994-12-01), Yonehara
patent: 5492859 (1996-02-01), Sakaguchi et al.
patent: 5536361 (1996-07-01), Kondo et al.
patent: 5670411 (1997-09-01), Yonehara et al.
patent: 5869387 (1999-02-01), Sato et al.
patent: 5980633 (1999-11-01), Yamagata et al.
patent: 6008540 (1999-12-01), Lu et al.
S. Tong Lee, et al., "Enhanced Oxygen Diffusion in Silicon at Thermal Donor Formation Temperatures", Appl. Phys. Lett., vol. 49, no. 26, pp. 1793-1795 (1986).
N. Sato, et al., "Hydrogen Annealed Silicon-on-Insulator", Appl. Phys. Lett., vol. 65, no. 15, pp. 1924-1926 (1994).
H. Takai, et al., "Isolation of Silicon Film Grown on Porous Silicon Laryer", J. Elect. Mat., vol. 12, no. 6, pp. 973-982 (1983).
L. Vescan, et al., "Low-Pressure Vapor-Phase Epitaxy of Silicon on Porous Silicon", Materials Letter, vol. 7, no. 3, pp. 94-98 (1988).
H. Takai, et al., "Porous Silicon Layers and Its Oxide for the Silicon-on Insulator Structure", J. Appl. Phys., vol. 60, no. 1, pp. 222-225 (1986).
T. Unagami, et al., "Structure of Porous Silicon Layer and Heat-Treatment Effect", J. Electrochem. Soc., volo. 125, no. 8, pp. 1339-1344 (1978).
T. Yonehara, et al., "Epitaxial Layer Transfer by Bond and Etch Back of Porous Si", Appl. Phys. Lett., vol. 64, no. 16, pp. 2108-2110 (1994).
K. Imai, "A new Dielectric Isolation Method Using Porous Silicon", Solid State Elec., vol. 24, no. 2, pp. 159-164 (1981).
A. Uhlir, Jr., "Electrolytic Shaping of Germanium and Silicon", Bell System Tech. J., vol. 35, pp. 333-347 (1956).
K. Izumi, et al., "C.M.O.S., Devices Fabricated on Buried SiO.sub. layers formed by oxygen implantation into Silicon", Elec. Lett., vol. 14, no. 18, pp. 593-594 (1978).
J. B. Lasky, et al., "Silicon-on Insulator (SOI) by Bonding and Etch-Back", IntO'l. Elec. Devices Meeting, Washington DC, pp. 684-687 (1985).
Canon Kabushiki Kaisha
Niebling John F.
Simkovic Viktor
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