System for detecting faults in connections between integrated ci

Details System for detecting faults in connections between integrated ci System for detecting faults in connections between integrated ci

1995-06-22

1998-04-07

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

324537, G01R 3104

Patent

active

057368627

ABSTRACT:
A system for detecting open circuits in connections between pins of an integrated circuit (IC) and traces on a circuit board on which the IC is mounted makes use of a-c paths inherent in the IC. An input signal is applied to a trace to which a pin of the IC is nominally connected. An internal a-c path in the IC carries the signal to another pin. Failure to detect an output signal derived from the input signal, above predetermined thresholds, at the trace to which the latter pin is nominally connected indicates failure of a pin-to-trace connection.

REFERENCES:
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patent: 5521513 (1996-05-01), Stringer
"Latent Open Testing of Electronic Packaging" Arnold Halpern, Thomas H. DeStefano and Shinwu Chiang, pp. 83-88, 0-8186-5560-7/94 Jul. 1994 IEEE.

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