Method for generating test programs

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371 27, G06F 1700

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active

054885736

ABSTRACT:
The purpose of this invention is to automatically generate high quality test programs for the functional testing stage of microprocessor design. Programs for the functional testing are generated by a computer program using a random instruction generator. The generator produces instructions using four levels of abstraction: instructions, instruction categories, sequences, and functions. By choosing the level from which to pick instructions, test programs containing complicated sequences can be created, while at the same time random numbers may be used to produce instructions.

REFERENCES:
patent: 4716364 (1987-12-01), Hung et al.
patent: 5041742 (1991-08-01), Carhonaro
patent: 5281864 (1994-01-01), Hahn et al.
patent: 5301301 (1994-04-01), Kodosky et al.
Schnurmann; "Program for Weighted Test Pattern Generation in Monte Carlo Testing of Integrated Testing"; IBM Technical Disclosure Bulletin vol. 16, No. 2, 1973.
Peters et al; "Automatic Generation of Bit Patterns for Array Testing"; IBM Tech. Dis. vol. 25, 7B, 1982.
Nagle et al; "Microprocessor Testability" IEEE Trans. on Ind. Electronics vol. 36, No. 2, 1989.
Thatte et al., "Test Generation for Microprocessors", IEEE Transactions on Computers, vol. C-29, No. 6, Jun. 1980, pp. 429-441.
Bellon et al., "Automatic Generation of Microprocessor Test Programs", 19th Design Automation Conference, 1982, Paper 33.2, pp. 566-573.
Middleton, "Functional Test Vector Generation for Digital LSI/VLSI Devices", 1983 International Test Conference, Paper 22.3, pp. 682-691.
Hunger et al., "Functional Characterization of Microprocessors", 1984 International Test Conference, Paper 24.1, pp. 794-803.
Brahme et al., "Functional Testing of Microprocessors", IEEE Transactions on Computers, vol. C-33, No. 6, Jun. 1984, pp. 475-485.
Su et al., "Functional Testing Techniques for Digital LSI/VLSI Systems", ACM IEEE 21st Design Automation Conference, 1984, pp. 517-528.
Lin et al., "Automatic Functional Test Program Generation for Microprocessors", 25th ACM/IEEE Design Automation Conference, 1988, Paper 38.7, pp. 605-608.
Klug, "Microprocessor Testing by Instruction Sequences Derived from Random Patterns", 1988 Internatonal Test Conference, Paper 4.2, pp. 73-80.
Talkhan et al., "Microprocessors Functional Testing Techniques", IEEE Transactions on Computer-Aided Design, vol. 8, No. 3, Mar. 1989, pp. 316-318.
Wagner et al., "Pseudorandom Testing", IEEE Transactions on Computers, vol. C-36, No. 3, Mar. 1987, pp. 332-343.

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