Method to form hemi-spherical grain (HSG) silicon from amorphous

Semiconductor device manufacturing: process – Making passive device – Stacked capacitor

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438593, 438665, 438684, 438964, H01L 2170

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active

056565313

ABSTRACT:
An embodiment of the present invention develops a process for forming Hemi-Spherical Grained silicon by the steps of: forming amorphous silicon from a gas source comprising at least one of dichlorosilane, disilane or trisilane, wherein the amorphous silicon comprising at least one impurity doped amorphous portion, the amorphous silicon is deposited at a deposition temperature no greater than 525.degree. C; and annealing the amorphous silicon for a sufficient amount of time and at an elevated annealing temperature, thereby transforming the amorphous silicon into the Hemi-Spherical Grained silicon.

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Uemoto et al in "IEEE Symposium on VLSI Technology" 1990, pp. 2821-2822.
"A New Cylindrical Capacitor Using HSG Si for 256 Mb DRAMS" by Watanabe et al IEDM, 1992, pp. 259-262.

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