Method of making sub-micron dimensioned NPN lateral transistor

Metal treatment – Compositions – Heat treating

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Other Related Categories

29576B, 29578, 148175, 148187, 357 34, 357 91, H01L 2122, H01L 2131

Type

Patent

Status

active

Patent number

044153716

Description

ABSTRACT:
An array of hundreds of devices may be simultaneously processed on a chip to sub-micron dimensions by establishing tiny active regions for each transistor surrounded by field oxide filled motes or slotted regions, wherein the slots are utilized to dope the substrate within the action region. The N type substrate is double energy boron planted through one surface to establish a P region to a given depth. This surface is oxidized and photoresist masked conventionally to open regions for the slots which are ion milled or ODE etched to a given depth. N+ regions are established by the slots by ion implanting at an angle such that the entire depth of the slot is not doped but rather the doping is confined to a region within the double energy P implanted depth. Drive-in diffusion enlarges the N+ areas for the emitter and collecter and oxidation fills the mote insulating regions around the active area.
The oxide is stripped and the P region enhanced to P+ at the surface, with silox being deposited and opened for metal contacts to the P+ region for the base and the emitter and collector regions. The doping profile of the base region provides a potential barrier to minimize the flow of electrons toward the surface because the emitter electrons are channeled through the less heavily doped part of the base region to the collector.

REFERENCES:
patent: 4047975 (1977-09-01), Widman
patent: 4140558 (1979-02-01), Murphy et al.
patent: 4211582 (1980-07-01), Horng et al.
patent: 4264382 (1981-04-01), Anantha et al.
patent: 4309812 (1982-01-01), Horng et al.
patent: 4318751 (1982-03-01), Horng
patent: 4339767 (1982-07-01), Horng et al.
Berndlmaier et al. IBM-TDB, 22 (1980) 4543.
Brack et al. IBM-TDB, 16 (1974) 3287.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of making sub-micron dimensioned NPN lateral transistor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of making sub-micron dimensioned NPN lateral transistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making sub-micron dimensioned NPN lateral transistor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-158006

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.