Method of testing bubble memory devices

Details Method of testing bubble memory devices Method of testing bubble memory devices

1983-12-12

1986-05-27

Fleming, Michael R.

Excavating

365201, G06F 1300, G01R 3312

Patent

active

045920524

ABSTRACT:
A method of testing bubble memory devices each having a plurality of minor loops, the method being useful for detecting defective minor loops in a short time. In this method, data to be written in and/or data to be read out is divided into and stored as a plurality of blocks, the bubble memory device is sequentially operated under driving magnetic field and/or bias magnetic field conditions different for every block, and a defective minor loop or loops are detected by comparing readout data with write-in data.

REFERENCES:
patent: 4221003 (1980-09-01), Chang
patent: 4233668 (1980-10-01), Yamaguchi et al.
patent: 4234935 (1980-11-01), Schreiner
patent: 4400809 (1983-08-01), Whitinger
patent: 4414646 (1983-11-01), Boutin
patent: 4456974 (1984-06-01), Cooper
patent: 4459549 (1984-07-01), Iwasa

Affiliated with

Also associated with

Rating

Method of testing bubble memory devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of testing bubble memory devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of testing bubble memory devices will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1575320