Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1989-01-23
1990-09-18
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
356 1, G01B 1124
Patent
active
049573691
ABSTRACT:
Automatic acquistion and anaylsis for three-dimensional surface geometries is accomplished by use of an opto-electronic technique which exploits large-linear-area lateral-photo-effect-diodes and employs a reflected, tightly focused light spot. The technique consists of one very small light spot pulsed for example at 10,000 Hertz with a 50% duty cycle. The light spot is focused on the surface to be measured and scanned across it stopping for, in one example, 50 microseconds each time it is illuminated. The diode detectors mounted in the focal plane of a pair of cameras, return azimuth and elevation information for each spot. Knowledge of the location and orientation of the cameras, as well as calibration corrections for each camera, completes the information necessary to reconstruct the full three-dimensional location of each reflected light spot.
REFERENCES:
patent: 4534650 (1985-08-01), Clerget et al.
"Noncontact Visual Three-Dimensional Ranging Devices" by Takeo Kanade and Haruhiko Asada of Robotics Institute, Carnegie-Mellon University, Pittsburgh, Pennsylvania published in the SPIE vol. 283 `3-D Machine Perception` 1981, pp. 48 through 53.
"Laser Electro-Optic System for Rapid Three-Dimensional (3-D) Topographic Mapping of Surfaces" by Altschuler, Altschuler and Taboada published in vol. 20, No. 6 of `Optical Engineering`, Nov./Dec. 1981 pp. 953 through 961.
"Gait Analysis-Precise, Rapid, Automatic, 3-D Position and Orientation Kinematics and Dynamics" by Robert W. Mann and Erik K. Antonsson in vol. 43, No. 2 of the `Bulletin of the Hospital for Joint Diseases Orthopaedic Institute`, published in 1983 at pp. 137 through 146.
"A New Semiconductor Photocell Using Lateral Photoeffect" by J. Torkel Wallmark, Proceedings of the IRE 45:474-484 1957.
California Institute of Technology
Evans F. L.
Tachner Leonard
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