Materials inspection system using x-ray imaging

X-ray or gamma ray systems or devices – Electronic circuit – X-ray source power supply

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

378 99, H05G 164

Patent

active

049875841

ABSTRACT:
A material inspection system, such as a baggage insepction system, uses x-ray imaging to identify organic materials such as drugs and explosives. The articles being inspected are transirradiated with x-rays having different radiation energies. From detected radiation, attenuated by the article under inspection, a materials information signal and a luminance signal are formed. The color of the monitor image is controlled by the materials information signal, and the image brightness, color saturation and white content of the image are controlled by the luminance signal. A color portrayal occurs only when the materials information signal has a sufficiently high signal-to-noise ratio.

REFERENCES:
patent: 4686695 (1987-08-01), Macovski

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Materials inspection system using x-ray imaging does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Materials inspection system using x-ray imaging, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Materials inspection system using x-ray imaging will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1559547

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.