Reflectometer based on optical cavity decay time

Details Reflectometer based on optical cavity decay time Reflectometer based on optical cavity decay time

1983-10-11

1986-02-18

McGraw, Vincent P.

Optics: measuring and testing

Of light reflection

356124, G01N 2155

Patent

active

045710856

ABSTRACT:
A method and apparatus for making decay time measurements of an optical cavity having at least two reflecting optical elements by directing a beam of light into the cavity, switching the beam of light off when the intensity in the cavity reaches a predetermined threshold level, monitoring the beam intensity decay of the optical cavity, and measuring the intensity decay time either with a storage oscilloscope or a digital counter.

REFERENCES:
patent: 3737231 (1973-06-01), Low et al.
patent: 3927946 (1975-12-01), McClure
patent: 4019156 (1977-04-01), Fountain et al.
patent: 4136954 (1979-01-01), Jamieson
patent: 4176327 (1979-11-01), Wayne et al.
Virgil Sanders, High-Precision Reflectivity Measurement Technique for Low-Loss Laser Mirrors, Applied Optics, vol. 16, No. 1, Jan. 1977, pp. 19 and 20.
J. M. Herbelin, et al., Sensitive Measurement of Photon Lifetime and True Reflectances in an Optical Cavity by a Phase-Shift Method, Applied Optics, vol. 19, No. 1, Jan. 1, 1980, pp. 144-147.
J. M. Herbelin, et al., Development of Laser Mirrors of Very High Reflectivity Using the Cavity-Attenuated Phase-Shift Method, Applied Optics, vol. 20, No. 19, Oct. 1, 1981, pp. 3341-3344.

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