Infrared inspection system and method employing emissivity indic

Details Infrared inspection system and method employing emissivity indic Infrared inspection system and method employing emissivity indic

1991-10-01

1994-03-15

Cuchlinski, Jr., William A.

Thermal measuring and testing

Leak or flaw detection

374124, 374128, 374137, 374126, 374 5, 250332, G01N 2572

Patent

active

052941981

ABSTRACT:
A unit having differing thermal emissivities at differing regions thereof is monitored with an infrared camera for deriving a signal having magnitudes representing infrared emission from multiple pixels in the camera field of view. A computer responsive to the signal (a) stores data representing emissivity and standard temperature of the unit at each of the pixels, (b) combines indications of the infrared emission from each pixel and the stored data representing emissivity of each pixel to derive an indication of monitored temperature of each pixel, (c) compares the stored data representing standard temperature of each pixel and the indications of monitored temperature of each pixel, and (d) derives an indication of the deviation between the magnitude of the standard temperature and monitored temperature at each pixel. In response to the indication of the deviation at each pixel, a property of the unit related to the deviations at the pixels is derived.

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