Method for planarizing semiconductor structure using subminimum

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437 67, 437 78, 437 90, H01L 21465

Patent

active

052926893

ABSTRACT:
The invention provides a method for planarizing over a recessed area of a semiconductor structure. The method involves the creation of a series of subminimum (i.e. 50 to 500 Angstroms thick) silicon pillars extending vertically upward from the base of a wide trench, and oxidizing the pillars. When the substrate is covered with a conformal CVD oxide, the pillars prevent the formation of a single deep depression above the trench.

REFERENCES:
patent: 4211582 (1980-07-01), Horng et al.
patent: 4407695 (1983-10-01), Deckman et al.
patent: 4493740 (1985-01-01), Komeda
patent: 4576834 (1986-03-01), Sobezak
patent: 4671851 (1987-06-01), Beyer et al.
patent: 4753901 (1988-06-01), Ellsworth et al.
patent: 4789648 (1988-12-01), Chow et al.
patent: 4803181 (1989-02-01), Buchmann et al.
patent: 4810669 (1989-03-01), Kobayashi
patent: 4879257 (1989-11-01), Patrick
patent: 4916087 (1990-04-01), Tateoka et al.
patent: 5137837 (1992-08-01), Chang et al.
A. Schiltz and M. Pons, J. Electrochem, Soc. 133:178-181 (1986).
W. M. Goubau, IBM Technical Disclosure Bulletin, vol. 26, No. 10A, p. 4995 (1984).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for planarizing semiconductor structure using subminimum does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for planarizing semiconductor structure using subminimum , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for planarizing semiconductor structure using subminimum will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-152976

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.