Load circuit for integrated circuit tester

Details Load circuit for integrated circuit tester Load circuit for integrated circuit tester

1997-08-29

1999-09-14

Nguyen, Vinh P.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

G01R 1900

Patent

active

059528214

ABSTRACT:
A load circuit for an integrated circuit tester provides an adjustable load at a terminal of an integrated circuit device under test (DUT) when the DUT is generating an output signal at the terminal. The load circuit includes positive and negative current sources for producing positive and negative currents of magnitudes that are non-linear functions input reference voltages. A diode quad connects the negative current source to the DUT terminal when the DUT output signal is below an input threshold voltage and connects the positive current source to the DUT terminal when the DUT output signal is above the threshold voltage. The current sources provide a non-linear, exponential, transfer function between input reference voltage and output current magnitude so that the current sources provide a relatively wide output current range in response to a relatively narrow input reference voltage range.

REFERENCES:
patent: 3849726 (1974-11-01), Justice
patent: 4712058 (1987-12-01), Branson et al.
patent: 4720671 (1988-01-01), Tada et al.
patent: 5276355 (1994-01-01), Nagata

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